Prepare scanner branch for merge

docs/ARCHITECTURE.md

@@ -49,10 +49,19 @@ flowchart LR
 
 | Module | Responsibility |
 | --- | --- |
-| `electron/main.ts` | Window lifecycle, capture source listing, Smart Capture, OCR crop generation, overlay window IPC, input/capture sidecar orchestration, JSON artifact store, dev-only scanner control endpoints |
+| `electron/main.ts` | Electron app composition, dependency wiring, app lifecycle, hotkeys, and IPC/dev-control registration |
+| `electron/appWindowManager.ts` | Main window and overlay window lifecycle, menu-bar removal, dashboard focus behavior, and renderer window command delivery |
+| `electron/services/inputHelper.ts` | Stable JSON protocol client for the compiled C# input/capture sidecar plus PowerShell fallback startup |
+| `electron/services/inputHelperPowerShellFallback.ts` | PowerShell fallback script body for environments where the compiled helper is unavailable |
+| `electron/services/goodFileService.ts` | Local GOOD export file writing and GOOD import file dialog/read handling |
 | `electron/preload.cjs` | Safe renderer bridge exposed as `window.assistantApi` |
 | `src/lib/artifactStore.ts` | Pure signature/id/record helpers for the persistent artifact store |
-| `src/App.tsx` | Main app shell, scan view, triage view, build view, overlay preview |
+| `src/App.tsx` | Thin React entry that renders the app page |
+| `src/pages/AppPage.tsx` and `src/pages/app/*` | App page composition and high-level layout routing |
+| `src/features/scan/hooks/useScanViewController.ts` | Scan feature state composition and view-controller assembly |
+| `src/features/scan/hooks/scanViewScanActions.ts` | Manual scan and visible-grid scan orchestration |
+| `src/features/scan/hooks/scanViewEntryActions.ts` | Guided auto-entry choreography for visible inventory, direct inventory, and IK-style fallback paths |
+| `src/features/scan/hooks/useScanGoodInterop.ts` | Scan-page GOOD import/export actions against renderer repository ports |
 | `src/lib/artifactOcrParser.ts` | Converts OCR output into a parsed artifact candidate with confidence and notes |
 | `src/lib/fuzzyMatch.ts` | Generic fuzzy string matching for OCR text against known game data |
 | `src/lib/genshinLookup.ts` | Pure lookup and validation API for generated Genshin data |
@@ -63,6 +72,9 @@ flowchart LR
 | `src/data/genshinGameData.json` | Generated local dictionary of characters, artifact sets, slots, and stats |
 | `scripts/generate-genshin-data.cjs` | Regenerates the local Genshin dictionary from `genshin-db` |
 | `src/types/*` | Shared app, capture, and domain contracts |
+| `src/styles/global.css` | Stylesheet entrypoint importing split style modules |
+| `src/styles/base.css` | Shared application, layout, scanner workspace, modal, triage, build, and overlay styles |
+| `src/styles/diagnostics.css` | Diagnose/dev-view specific styles |
 
 ## Dependency Rules
 
@@ -129,7 +141,8 @@ sequenceDiagram
 - SendInput's return value is checked: zero injected events (UIPI, e.g. elevated Genshin vs. non-elevated app) aborts with an explicit hint instead of silently clicking into nothing.
 - Dev-only probes under `http://127.0.0.1:17317` are used for live validation:
   `/automation/probe-click?index=N` tests one read-only tile selection, and
-  `/scanner/start?limit=N` starts an auto-scan with a temporary limit payload.
+  `/scanner/start?entry=visible-inventory&limit=N` starts an auto-scan with a
+  temporary limit payload from an already visible artifact detail view.
   The live known-good result on 2026-07-07 is documented in
   [AUTOMATION_LIVE_SCAN.md](AUTOMATION_LIVE_SCAN.md).
 - Click verification: after each click the parsed detail-panel signature should change. An unchanged signature is a soft miss (it can also mean two OCR-identical neighbor pieces, common among +0 artifacts), so it is retried once with a small offset, logged with the stuck artifact name, and then skipped - never fatal on its own. The scan aborts only when the first ~6 clicks of page 1 produce nothing new (diagnosis hint: elevated Genshin blocks SendInput via UIPI, or grid coordinates are wrong) or a later page yields zero new artifacts.
@@ -140,15 +153,25 @@ sequenceDiagram
 - Guided auto-entry is state gated. The normal scan button first performs a
   lightweight no-OCR preflight; OCR/store/review work starts only after the
   artifact inventory grid and artifact detail card are visually confirmed.
-- The entry path tries direct inventory (`B`) first and uses the IK-style
-  ESC/B fallback only when direct entry does not reach an artifact detail card.
-- Card and page waits are fingerprint based. The scanner can proceed as soon as
-  the expected visual state changes and stabilizes, while still accepting IK-like
-  200 ms item and 100 ms scroll readiness points.
+- The normal scan button does not navigate into inventory when that preflight
+  fails; it blocks and asks the operator to open the Artifact inventory with a
+  visible detail card. Explicit Dev-Control entry modes can still test direct
+  inventory or Paimon-menu choreography, but they are not the merge-ready
+  default path.
+- Item verification uses the artifact OCR capture's own detail fingerprint, so
+  the loop no longer performs a separate card-ready capture before OCR. Page
+  waits remain fingerprint based and can proceed as soon as the inventory pane
+  changes and stabilizes, while still accepting IK-like 100 ms scroll readiness
+  points.
 - Scrolling sends one wheel notch per grid row with the cursor anchored over the inventory (assumption: roughly one row per notch; overlap is absorbed by dedupe, and a page without new artifacts stops the scan).
 - The scan never deletes, enhances, feeds, locks, or spends anything; it only selects tiles to read them.
 
 Parsed artifacts from both modes are persisted into `artifact-store.json` keyed by a content signature that excludes the equipped character, so re-equipping updates a record instead of duplicating it. Leveling an artifact currently creates a new record (documented limitation until rescan-merge exists).
+During auto-scan, artifact store writes can be batched and flushed after the
+click/capture/OCR loop to avoid per-artifact save/reload churn in the hot path.
+Auto-scan artifact captures also bypass Electron source-list enumeration and use
+the GDI capture helper directly once the selected source/Genshin state has been
+preflighted. Manual captures and source refresh still use `desktopCapturer`.
 
 ## Security And Safety